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- čas přidán 5. 09. 2024
- In this video we explore the good, bad and ugly aspects of switching time measurements on bipolar transistors (BJTs). We find that the switching time measurements (rise time, fall time, delay time and storage time) are all highly dependent upon the test circuit and test conditions - and that these conditions are not standardized by any particular device type of manufacturer. Notes for this video are here:
www.qsl.net/w2a...