Mitutoyo Quick Vision QV-WLI series.

Mitutoyo's QV-White Light Interferometry (QV-WLI) series combines all comprehensive functionality and optical performance of Quick Vision with high accuracy 3D topography evaluation, IN ONE MACHINE!
WLI with standard Mitutoyo Quick Vision optical head enables a wide range of powerful measurements, from 2D measurement of coordinates and dimensions, surface analysis in microscopic areas, to depth measurement of microstructures.
With Mitutoyo's WLI head get nanometer resolution in height measurements over big XY measuring range. Ideal for evaluating samples with high aspect ratio where accuracy is of paramount importance, such as MEMS, nano imprint molds, screen masks etc.
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