Contamination Control Solutions throughout the Semiconductor Manufacturing process
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- čas přidán 21. 11. 2023
- Complete solutions for contamination monitoring and control throughout semiconductor manufacturing.
20 nm for liquids: chemicals and Ultrapure water
batch sampling options to 20nm
Airborne molecular at 70 ppt
10 nm condensation airborne particle counter
use with a Particle Seeker manifold for wide areas.
Supported by global team of application engineer experts. - Věda a technologie